PXI-5154
May 27, 2026

PXI-5154

Product Introduction The PXI-5154 is the highest bandwidth model in the NI 5100 series, a 3U PXI hybrid bus dual-channel high-speed digitizer. It features a 1 GHz bandwidth, 2 GS/s real-time sampling, deep storage, and ps-level synchronization from NI. It has an 8-bit ADC, with single-channel 2 GS/s and dual-channel 1 GS/s synchronization; equivalent time sampling of 20 GS/s (repeated signals); and 8/64/256 MB onboard memory per channel, suitable for automated testing and high-speed streaming acquisition of high-speed RF, digital, semiconductor, radar/pulse signals.

Description

Model Explanation

PXI: 3U standard PXI hybrid bus, single slot, compatible with PXI/PXIe chassis and NI.

5154: NI 5100 series, representing 2 channels, 1 GHz bandwidth, 2 GS/s, 8-bit high-speed PXI oscilloscope NI.

Component Number (by memory):

780320‑01: 8 MB / channel

780320‑02: 64 MB / channel

780320‑03: 256 MB / channel

Technical Specifications (25℃, preheating 15 min):

Channels: 2 analog inputs, synchronous sampling NI.

Resolution: 8 bits.

Sampling Rate: Real-time: single channel 2 GS/s, dual channel 1 GS/s; equivalent time: 20 GS/s (repeated signal).

Analog Bandwidth: 1 GHz (‑3 dB), DC–1 GHz, VSWR < 1.27 NI.

Input Voltage Range: 0.1/0.2/0.5/1/2/5 Vpp (±50 mV to ±2.5 V) NI.

Input Impedance: 50 Ω ±2% (fixed, not selectable 1 MΩ) NI.

Coupling Mode: AC / DC / GND (per channel independent) NI.

Onboard Memory: 8/64/256 MB / channel.

Rise Time: ≤350 ps (50 Ω, 10%–90%) NI.

Trigger: edge, window, hysteresis, digital, immediate, software; 5 ps time resolution; pre / post trigger.

Clock: internal 2 GHz VCSO; external 10–200 MHz; phase-locked PXI 10 MHz reference.

Power Consumption: approximately 24 W NI.

Size / Weight: 3U single slot, approximately 480 g.

Environment: operating 0–55℃; storage –40–70℃; humidity 10%–90% RH (no condensation).

Signal-to-Noise Ratio SINAD: typical 40 dB (ENOB ≈ 6.5 bits).

Crosstalk: 100 MHz <‑65 dB; 1 GHz <‑40 dB.

Interface and Communication Configuration

Front panel interface NI

2×BNC (CH0/CH1): analog input (50 Ω)

1×BNC (TRIG): external analog trigger input

1×SMB (CLK IN): external sampling clock / reference

1×SMB (CLK OUT): internal clock / reference output

2×SMB (PFI0/PFI1): digital trigger I/O, programmable function interface Indicator light

PWR (Green): Power supply is normal

RUN (Green): The acquisition is constantly on, waiting for trigger to flash

ERR (Red): Overheating, overcurrent, PLL lost lock, configuration error

Bus and Synchronization NI

PXI mixed bus, supports trigger bus, Star trigger, RTSI

Multi-module synchronous phase error < 50 ps, scalable to 34-channel coherent acquisition

Software driver NI

NI-SCOPE driver, supports LabVIEW, TestStand, Python, C#

NI MAX: Device management, self-check, configuration, calibration

Soft front panel SFP, high-speed waveform analysis, streaming inventory support Core function

1 GHz ultra-high bandwidth + 2 GS/s sampling: Covers RF, microwave, and high-speed digital signals, capturing sub-350 ps edges.

Equivalent 20 GS/s sampling: Ultra-high time resolution for repetitive signals, precise measurement of jitter, timing, and eye diagrams.

Maximum 256 MB/channel deep storage: Long-term high-speed recording, multi-segment waveform acquisition, long-term streaming.

50 Ω fixed impedance + AC/DC/GND coupling: Optimal matching for high-frequency signals, suitable for RF/microwave testing NI.

5 ps precise trigger and time base: Multiple trigger modes, precise capture of transient events and pulse signals.

High-speed streaming acquisition: Continuous data transmission and storage, suitable for long-term monitoring and mass production testing NI.

Multi-module ps-level synchronization: Star trigger / RTSI extends multi-channel coherent system, meeting MIMO radar/communication testing NI. Applicable scenarios

RF and microwave testing: RF / modulation / pulse signals within 1 GHz, radar, satellite communication, time-domain / frequency-domain analysis, NI.

High-speed digital testing: ultra-high-speed interfaces, FPGA, clock / jitter, eye diagram testing (edge < 400 ps), NI.

Semiconductor testing: high-frequency transient, pulse, RF parameters, high-speed acquisition of process characteristics, NI.

Radar and electronic warfare: pulse radar, signal intelligence, capture of high-speed transient electromagnetic signals, NI.

Research and defense: pulse laser, high-speed physics, transient electromagnetic, mass spectrometry, particle physics experiments, NI.

High-speed automated testing: high-speed boards for consumer electronics, aerospace, life sciences, and mass production testing, NI.

User and maintenance instructions

Installation and power-on

Power off for installation, single slot fixed; chassis reliably grounded to prevent static electricity NI.

Power on for 15 minutes for preheating, NI MAX self-check without hardware errors NI.

Keep ventilation during operation, temperature ≤ 55℃, do not block fans NI.

Connections and operations

High-frequency / RF signals use 50 Ω high-precision coaxial cables, BNC tightened to reduce reflection and loss NI.

Input prohibited > ±3 V (5 Vpp range), to avoid damaging the front end NI.

Trigger source preferentially selects signals within the channel, set appropriate trigger level to avoid false triggering; high-speed signals prefer edge triggering.

Multiple modules synchronize using PXI Star trigger to ensure ps-level phase consistency NI.

Maintenance and calibration

It is recommended to conduct NIST traceable calibration once every 2 years; daily internal self-calibration to compensate for temperature drift and time base errors.

Regularly clean BNC/SMB interfaces of dust, keep dry; for long-term idle, add a dust cap NI.

Environment free of condensation, humidity 10%–90% RH, away from strong electromagnetic interference and vibration NI.

Do not plug in or out cables while powered on; avoid severe vibration and impact NI.


Get a Quote