PXIE-4144
Description
Model Nomenclature
PXIe: PXI Express high‑speed modular bus
41: Precision SMU series
44: 4‑channel, ±6 V/±500 mA, 150 pA sensitivity, high‑speed sequencingNI
Technical Specifications
Form factor: 3U single‑slot PXIe module
Channels: 4 independent, 60 VDC CAT I isolation (channel‑to‑ground)
Voltage range: ±6 V, min step 0.1 mV
Current range: ±500 mA, six auto‑ranging scales (500 mA / 100 mA / 10 mA / 1 mA / 100 µA / 10 µA)NI
Power: 3 W sink/source per channel
Current sensitivity: 150 pA (10 µA range)NI
Sampling rate: up to 600 kS/s (V/I simultaneous)NI
Update rate: up to 100 kS/sNI
Voltage accuracy: ±0.015% reading + 50 µV
Current accuracy: ±0.025% reading + 150 pA (10 µA range)
Remote sense: 4‑wire with guard, programmable output impedance
Protection: OVP, OCP, reverse polarity, overtemperature
Operating temperature: 0 °C to 55 °C (18 °C to 28 °C for rated accuracy)
Storage temperature: −40 °C to 70 °C
Connector: 25‑pin D‑Sub (male)
Dimensions: 20 mm × 130 mm × 216 mm
Weight: approx. 408 g
Interface and Communication
Bus: PXIe Gen1, Windows plug‑and‑play
Driver: NI‑DCPower v1.7.5 or laterNI
Software: NI‑MAX, InstrumentStudio, LabVIEW, C/C++, Python
Trigger: PXI trigger lines 0–7, multi‑module hardware synchronizationNI
I/O: Front‑panel 25‑pin D‑Sub for all signals
Core Features
Four‑quadrant operation: source/sink bidirectional power for active devicesNI
150 pA sensitivity: precise low‑current and leakage measurementsNI
High current drive: up to 500 mA per channel for power devices and PMICsNI
SourceAdapt technology: predefined transient response settings to minimize overshootNI
4‑wire remote sense with guard: eliminates lead resistance and common‑mode errorsNI
Fast sequencing: hardware‑timed IV sweeps, pulse tests, and parallel multi‑channel test flowsNI
Application Scenarios
Power semiconductors: low‑voltage MOSFETs, power diodes, and rectifiers
PMICs and multi‑rail ICs: high‑pin‑count ATE and parallel testing
Low‑leakage devices: analog switches, sensors, and MEMS
Battery and supercapacitor testing: high‑current charge/discharge cycling
High‑speed production test: fast IV characterization and transient captureNI
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