PXIE-4141
Description
Model Nomenclature
PXIe: PXI Express high‑speed modular instrumentation bus.
41: Denotes the precision SMU series.
41: Indicates a 4‑channel, ±10 V, ±100 mA configuration with 10 pA sensitivity, enhanced SourceAdapt, and faster sampling than the 4140NI.
Technical Specifications
Basic Parameters
Form Factor: 3U single‑slot PXIe module
Channels: 4 independent channels (bank‑isolated 60 VDC CAT I to ground, common LO)NI
Voltage Range: ±10 V (min. step 0.1 mV)
Current Range: ±100 mA, 5 auto‑ranging scales: 100 mA / 10 mA / 1 mA / 100 µA / 10 µAdownload.ni.com
Power per Channel: 1 W (source/sink)
Current Sensitivity: 10 pA (10 µA range)NI
Sampling Rate: Up to 600 kS/s (simultaneous V/I)NI
Update Rate: Up to 100 kS/sNI
Electrical Performance
Voltage Accuracy: ±0.02% of range + 20 µV
Current Accuracy: ±0.03% of range + 10 pA (10 µA range)NI
Remote Sense: 4‑wire with guard (eliminates IR drop)NI
Output Impedance: Programmable
Protection: Overvoltage, overcurrent, overtemperature, reverse polarity
Environmental & Mechanical
Operating Temperature: 0 °C to 55 °C (23 °C ±5 °C for rated accuracy)
Storage Temperature: -40 °C to 70 °C
Humidity: 10%–70% (non‑condensing)
Warm‑Up Time: 30 minutes (for full accuracy)
Calibration Interval: 1 year (recommended)
Connector: 25‑pin D‑Sub (male)
Dimensions: 20 mm × 130 mm × 216 mm
Weight: 425 g
Interface and Communication Configuration
Bus: PXIe Gen1, plug‑and‑play for Windows
Control Software: NI‑MAX, InstrumentStudio
Programming Environments: LabVIEW, LabWindows/CVI, C++, Python (NI‑DCPower driver v1.6+)NI
Triggering: PXI trigger lines 0–7 (hardware sync)
Synchronization: Multi‑module triggering, sequence linking
Isolation: 60 VDC channel‑to‑ground (CAT I)NI
Core Features
10 pA Ultra‑High Sensitivity: Enables leakage, sub‑threshold, and nano‑device measurements unattainable with standard SMUsNI.
Four‑Quadrant Operation: Bi‑directional sourcing/sinking (±10 V, ±100 mA) for true DC characterizationNI.
SourceAdapt Technology: Programmable transient response to stabilize any load, minimize overshoot, and protect sensitive DUTsNI.
4‑Wire Remote Sense with Guard: Eliminates wiring resistance and common‑mode errors in low‑current setupsNI.
High‑Speed Sequencing: Hardware‑timed I‑V sweeps, pulses, and multi‑channel sync up to 100 kS/sNI.
Multi‑Mode Operation: Single‑point, sequence, and advanced sequencing modesNI.
Application Scenarios
Semiconductor & Nano‑Device Test: MOSFET sub‑threshold, diode leakage, organic semiconductors, 2D materials, and quantum device characterizationNI.
High‑Pin‑Count ATE: SoCs, FPGAs, and multi‑channel components requiring pA‑level precisionNI.
Precision Component Test: Resistors, capacitors, sensors, and MEMS with ultra‑low current requirementsNI.
Aerospace & Defense: Avionics, radar, and high‑reliability component validationNI.
Battery & Energy Storage: Low‑capacity cells, supercapacitors, and fuel cell testingNI.
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