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PXIE-2514

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PXIE-2514
May 27, 2026

PXIE-2514

The PXIe-2514 (NI Part Number: 780587-14) is a 7-channel high-current fault insertion unit (FIU) for PXI Express systems, designed by National Instruments. It is a 3U two-slot module using FET switches, supporting feedthrough channels that remain transparent when closed. It can simulate opens, pin-to-pin shorts, shorts to battery, and shorts to ground per channel. With 28 VDC maximum switching voltage, 40 A continuous current, and 800 kHz bandwidth, it targets high-power hardware-in-the-loop (HIL) and electronic reliability testing.

Description

Model Nomenclature

  • PXIe: PXI Express high-speed modular instrument bus.

  • 25: Series identifier for switch/insertion modules.

  • 14: High-current FIU variant with 7 channels, 40 A rating, and dual fault buses.

Technical Specifications

  • Form factor: 3U, two‑slot PXIe.

  • Channels: 7 independent feedthrough channels (FET relays).

  • Max switching voltage: 28 VDC.

  • Continuous current: 40 A per channel; pulsed current up to 100 A (short duration).

  • Bandwidth: 800 kHz (50 Ω system).

  • On‑resistance: typically 8 mΩ per channel.

  • Switching time: 8 μs typical, 35 μs maximum.

  • Relay life: unlimited under rated conditions.

  • Protection: overcurrent (42 A typical), overtemperature.

  • Operating temperature: 0 °C to 50 °C; storage: -40 °C to 70 °C.

  • Power: 18 W (+12 V) via PXIe busNI.

Interface and Communication Configuration

  • Front panel: two 8‑position male DSUB connectors for signal I/O and fault bus connectionsNI.

  • Bus: PXIe Gen1, PXI trigger lines 0–7 for multi‑module synchronization.

  • Trigger: input minimum pulse width 150 ns; output pulse width software‑programmable.

  • Software: plug‑and‑play for Windows; configurable in NI‑MAX; programmable via LabVIEW, LabWindows/CVI, C++ APIsNI.

Core Features

  • High‑current fault simulation: 40 A continuous, supporting high‑power ECU and actuator testing.

  • Per‑channel fault modes: open, pin‑to‑pin short, short to battery, short to ground.

  • Feedthrough design: normal operation transparent to DUT; faults injected on demand.

  • Fast FET switching: microsecond‑level actuation for real‑time HILNI.

  • Integrated protection: overcurrent and overtemperature safeguard DUT and moduleNI.

  • Seamless PXIe integration: synchronize with other PXIe instruments for HIL systems.

Application Scenarios

  • Automotive ECU, BMS, and power distribution HIL testing.

  • Aerospace FADEC and avionics fault injection validation.

  • Industrial control and power electronics reliability testing.

  • High‑power wiring harness and connector fault simulation.

  • Battery system and high‑voltage component verification.

Usage and Maintenance Instructions

Installation and Configuration

Insert the module into a 3U two‑slot PXIe chassis and secure the latch. Connect DUT and fault bus lines to the DSUB connectors, verifying channel mapping. Power on the chassis; the system detects the module automatically. Use NI‑MAX to configure channels, fault buses, and triggers. Develop test sequences in LabVIEW or other supported environments. Verify all connections before applying power to avoid shortsNI.

Daily Maintenance

Keep the module and chassis clean, dry, and ventilated within rated temperature ranges. Avoid excessive force when mating DSUB cables. Inspect cables and connectors periodically for wear or looseness. Ensure adequate chassis cooling to prevent overtemperature. Store in a dry, antistatic environment when not in useNI.

Safety Notice

Do not apply voltages exceeding 28 VDC. Follow ESD procedures when handling the module. Disconnect all power before installation, removal, or servicing. Do not operate with damaged connectors. Dispose of according to local electronic waste regulations at end‑of‑lifeNI.


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