ZMI-2002
May 21, 2026

ZMI-2002

Model: ZMI‑2002 Manufacturer: ZYGO(AMETEK) Type: Dual‑axis, 6U VME laser interferometer receiver board Application: Semiconductor lithography, ultra‑precision positioning, machine tools, optical metrology, research labs Form Factor: 6U VMEbus(rev. C), also supports ISA bus Part Number: 8020‑0211 / 8020‑0211‑1‑J Weight: ~1.2 kg Dimensions: 229 × 114 × 29 mm

Description

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1. General Information

  • Model: ZMI‑2002

  • Manufacturer: ZYGO(AMETEK)

  • Type: Dual‑axis, 6U VME laser interferometer receiver board

  • Application: Semiconductor lithography, ultra‑precision positioning, machine tools, optical metrology, research labs

  • Form Factor: 6U VMEbus(rev. C), also supports ISA bus

  • Part Number: 8020‑0211 / 8020‑0211‑1‑J

  • Weight: ~1.2 kg

  • Dimensions: 229 × 114 × 29 mm

2. Measurement Performance(HeNe laser, λ=632.8 nm)

  • Channels: 2 axes synchronous measurement

  • Resolution:

    • 1‑pass LI: 0.62 nm

    • 2‑pass PMI: 0.31 nm

    • 4‑pass PMI: 0.15 nm

  • Accuracy: ±0.1 μm(sub‑micron)

  • Max Range: ±21.2 m(1‑pass);±10.6 m(2‑pass);±5.3 m(4‑pass)

  • Max Velocity:

    • 1‑pass: 4.2 m/s

    • 2‑pass: 2.1 m/s

    • 4‑pass: 1.05 m/s

  • Max Acceleration: 980 m/s²(100 g)

  • Data Age: 335 ns;uncertainty ±12 ns(2‑axis)

3. Electrical & I/O

  • Power: +5 VDC ±5%, 3.5 A(VME backplane)

  • Data Interface:

    • VMEbus(backplane)

    • P2 high‑speed link: up to 7.7 MHz

  • Data Formats:

    • Position: 36‑bit two’s complement

    • Velocity: 32‑bit two’s complement

    • Time: 32‑bit, 25 ns resolution;range 107.4 s

  • Fiber Optics: Reference + measurement inputs per axis

  • Synchronization: Clock in / clock out;programmable sync signals

4. Environmental

  • Operating Temp: 0 °C to +40 °C(precision applications)

  • Storage Temp: −20 °C to +70 °C

  • Humidity: 5%–95% RH, non‑condensing

  • Vibration: IEC 60068‑2‑6 compliant

  • Protection: Conformal coated;industrial ESD hardening

5. Key Features

  • 2‑axis simultaneous laser interferometry

  • Sub‑nanometer resolution(0.15 nm max)

  • High speed up to 4.2 m/s

  • VME/ISA/P2 multi‑bus compatibility

  • Precision timing(25 ns)& low jitter(±12 ns)

  • Modular expansion up to 16 axes

6. Applications

  • Semiconductor wafer stage & lithography positioning

  • Ultra‑precision machine tool feedback

  • Optical component manufacturing & testing

  • Vacuum & aerospace metrology

  • Nanopositioning & fundamental research


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