Model Nomenclature

• PXIe: PXI Express high‑speed modular instrumentation bus

• 25: NI switch/relay product series

• 69: 100‑channel SPST latching relay module, 100 V, 1 A, 20 MHz bandwidth

Technical Specifications

• Form factor: 3U, 1‑slot PXIe (hybrid/peripheral slot compatible)

• Relay topology: 100 independent SPST (NO) relays; software‑configurable as 50 DPST relays

• Relay type: Latching armature (Form A), gold‑plated contacts

• Number of channels: 100

• Bandwidth: DC to 20 MHz

• Maximum switching voltage: 100 VDC / 100 VAC (channel‑to‑channel/ground)

• Maximum switching current: 1 A per channelNI

• Maximum switching power: 60 W DC / 125 VA AC per channel

• Minimum switch load: 20 mV or 10 mA

• Actuation time: Typical 1 ms

• Relay life: >10⁶ operations (rated conditions)

• Scan rate: 145 cycles/s

• Scan list depth: 32,000 steps (deterministic scanning)NI

• Operating temperature: 0 °C to 55 °C; storage: −20 °C to 70 °C

• Power consumption: 5 W @ 12 V, 2 W @ 3.3 V (PXIe)

• Dimensions: 21.6 × 2.0 × 13.0 cm; weight: ~550 g

Interface and Communication Configuration

• Front‑panel I/O: 100×screw terminals (2‑wire per channel) for signal connections

• Bus: PXIe Gen1, plug‑and‑play (compatible with PXI hybrid slots)

• Triggering: PXI trigger lines 0–7; input trigger min. pulse width 150 ns; output trigger pulse width 1–62 μs for multi‑module synchronization

• Software support: NI‑MAX for configuration; LabVIEW, LabWindows/CVI, C++ APIs with NI‑SWITCH driverNI

• Compatibility: Windows OS, 3U PXI/PXIe chassis

Core Features

• High‑density 100‑channel design: Delivers the highest relay count per slot for compact, scalable test systemsNI.

• Software‑configurable topology: Reconfigures between 100 SPST or 50 DPST modes without hardware changes.

• Latching relay technology: Maintains state without continuous power, reducing power consumption and heatNI.

• Deterministic scanning: 32,000‑step scan list enables precise, repeatable automated test sequencesNI.

• Medium‑power handling: Supports up to 100 V / 1 A for switching power circuits, sensors, and low‑voltage devices.

• Overvoltage protection: Withstands 800 V impulse voltage and suppresses transients from inductive loads.

Application Scenarios

• Automated test equipment (ATE): High‑channel‑count signal routing for functional and parametric testing of PCBs, connectors, and electronic assemblies.

• Fault insertion testing: Simulating open/short circuits, voltage faults, and signal disruptions in embedded systems and automotive electronics.

• Power supply and load switching: Routing DC/AC power to DUTs, sensors, and actuators in industrial test benches.

• Semiconductor test: Low‑frequency signal switching for discrete components, ICs, and power devices.

• General‑purpose relay control: High‑density, cost‑effective relay control for research, validation, and manufacturing test systemsNI.

Usage and Maintenance Instructions

Installation and Configuration

Daily Maintenance

Safety Notice