PXI-2532B
May 27, 2026

PXI-2532B

Product Introduction The PXI-2532B is a 3U PXI high-density 512 cross-point matrix switch module launched by National Instruments (NI). It features a high-speed reed relay array and is specifically designed for high-channel-count automated test systems, used for multi-channel signal routing, switching, and fault injection. As an upgraded replacement model of PXI-2532, it has been fully optimized in terms of channel density, switching speed, and reliability. Currently, it is in the "Active" state and the part number is 782383-01NI.

Description

Model Explanation

PXI: PXI bus platform (modular instrument standard for testing and measurement)

2532: Product serial number, representing a 512 cross-point high-density matrix switch

Alias: PXI-2532, NI-2532, 778572-32 (part number)

Function Positioning: Reconfigurable matrix switch, supporting multiple topologies such as single-line and double-line, used for high-precision signal switching by NI

Technical Parameters

Cross-point Number: 512 (composed of 16 groups of 2×16 matrices) NI

Topology Configuration (Single Line): 4×128, 8×64, 16×32, dual 4×64, dual 8×32, dual 16×16, four 4×32 NI

Topology Configuration (Double Line): 4×64, 8×32, 16×16, dual 4×32 NI

Relay Type: Reed (dry contact), rhodium contacts NI

Maximum Switching Voltage: 300 Vrms (CAT II)

Maximum Switching Current: 0.5 A/channel, maximum switching power 10 W

Bandwidth: Single line ≥ 30 MHz, double line ≥ 25 MHz

Thermal Offset: < 1 μV (ultra-low thermoelectric potential)

Isolation Level: 150 V CAT II

Trigger Characteristics: PXI trigger line 0–7, minimum pulse width 150 ns; output trigger 1–62 μs, software selectable NI

Size: 3U PXI module (160 × 100 × 30 mm)

Weight: Approximately 0.8 kg

Status:停产; recommended replacement: PXIe-2532BNI

Interface and Communication Configuration

PXI Bus Interface: Standard 3U PXI backplane connector, providing power supply, trigger, clock and communication NI

Front-end I/O Connector: 2 × 160-pin Samtec BTE-EM series high-voltage connector NI

Terminal Block (optional): SCB-2586, etc., supports ribbon cable or screw terminal leads

Control Communication: PXI bus, compatible with NI- SWITCH, MAX configuration software NI

Trigger Synchronization: Hardware trigger input/output, supports synchronization with other instruments in the PXI system NI

Expansion Capability: Multiple modules can be cascaded through the terminal block to expand the matrix size NI Core function

High-density matrix switching: 512 cross points per slot, flexible configuration of multiple topologies, meeting the requirements of multi-channel signal routing for NI.

Ultra-low thermal offset: < 1 μV, suitable for low-level, high-precision measurements (such as thermocouple, sensor signals).

High-voltage isolation: 150 V CAT II isolation, allowing safe switching of mixed high-low voltage signals.

Hardware triggering and synchronization: nanosecond-level triggering, supporting high-speed scanning and multi-instrument synchronization, enhancing test throughput for NI.

Relay life monitoring: onboard relay count, predicting maintenance cycles, reducing unexpected downtime for NI.

Reconfigurable topology: flexible switching of single-line/double-line matrix through software and terminal block, adapting to different testing requirements for NI. Applicable scenarios

Aerospace electronic automation testing: Multi-channel signal switching and fault injection.

Semiconductor wafer testing: High-density probe card signal routing.

Automotive ECU verification: Sensor, load signal simulation and switching.

Industrial sensor network monitoring: Multi-node round-trip collection and switching.

Precise instrument calibration: High-precision switching of low-level and weak signals.

User Manual

Usage Tips

Installation: Insert into the standard 3U PXI chassis slot, lock the panel, and ensure the backplane connector makes reliable contact.

Configuration: Select the matrix topology through NI-SWITCH or MAX software, and define the channel mapping and trigger parameters NI.

Wiring: Connect the 160-pin connector to the terminal block (such as SCB-2586), and then transfer it to the tested device; for high voltage / large current, connect according to specifications to avoid overload.

Operation Monitoring: Use the onboard relay counting function to regularly read the number of switches, and evaluate the lifespan NI.

Environment: Working temperature 0–50 °C, avoid strong electromagnetic interference, dust and condensation.

Maintenance Instructions

Regular Inspection: Check the connector tightness, and whether the terminal block wiring is loose every quarter. Clean the surface dust.

Relay Life Management: Typical lifespan of reed relays: 10 V/100 mA approximately 10⁷ times; 20 V/500 mA approximately 5×10⁶ times; 100 V/10 mA approximately 5×10⁵ times. Replace the module in time when approaching the lifespan.

Model Interpretation

PXI: PXI bus platform (modular instrument standard for testing and measurement)

2532: Product serial number, representing 512 cross-point high-density matrix switch

B: Hardware version upgrade, optimizing relay lifespan, thermal electromotive force and bandwidth performance

Alias: NI-2532B, PXI-2532B (PXI bus version)

Function Position: Reconfigurable matrix switch, supporting single-line / double-line topology, suitable for high-precision signal switching

Technical Parameters

Cross-point Number: 512 (16×32 matrix architecture) NI

Topology Configuration (Single Line): 4×128, 8×64, 16×32, dual 4×64, dual 8×32, dual 16×16, four 4×32

Topology Configuration (Double Line): 4×64, 8×32, 16×16, dual 4×32

Relay Type: Reed (Reed), Rhodium contact, mechanical life 1×10⁹ times

Maximum Switching Voltage: 100 VDC / 100 Vp (CAT I)

Maximum Switching Current: 0.5 A / channel, maximum switching power 10 W

Bandwidth (–3 dB, 50 Ω): Single line ≥ 30 MHz, double line ≥ 25 MHz

Thermal Electromotive Force (Thermal EMF): Single line < 50 μV, double line < 20 μV NI

Channel Isolation (1 MHz): > 44 dB

Switching Speed: Maximum 2000 times / second NI

Trigger Characteristics: PXI trigger line 0–7, minimum pulse width 150 ns

I/O Connector: 2×150-pin Samtec ERM8-EM series

Size: 3U PXI module (160×100×30 mm)

Weight: Approximately 0.8 kg

Working Temperature: 0–50 °C

Interface and Communication Configuration

PXI Bus Interface: Standard 3U PXI hybrid backplane connector, providing power supply, trigger, clock and communication NI

Front-end I/O Connector: 2×150-pin Samtec ERM8-EM high-voltage connector, supporting high-density signal output Terminal Rack (Optional): TB-2640B, TB-2641B, etc., supports screw terminals or ribbon cable connections to NI

Control Communication: PXI bus, compatible with NI-SWITCH, MAX, LabVIEW, TestStand software from NI

Trigger Synchronization: Hardware trigger input/output, supports synchronization with other instruments in the PXI system, enhancing test throughput

Expansion Capability: Multiple modules can be cascaded with R1616 cables through the TB-264xB terminal rack, expandable to a 4×256 matrix Core function

High-density matrix switching: 512 cross points per slot, supports 10+ topologies, meets the requirements of multi-channel signal routing for NI.

Ultra-low thermal offset: less than 20 μV for dual wires, suitable for low-level high-precision measurement of thermocouples, sensors, etc. NI.

High-voltage isolation and protection: 100 V CAT I isolation, can safely switch mixed high and low voltage signals.

High-speed switching and synchronization: 2000 switching cycles per second, hardware-triggered nanosecond-level synchronization, improves test efficiency NI.

Relay life monitoring: onboard relay counter, predicts maintenance cycle, reduces unexpected downtime NI.

Flexible topology reconfiguration: software and terminal block cooperation, quickly switch between single-line and dual-line matrices, adaptable to different testing requirements NI. Applicable scenarios

Aerospace electronic automation testing: multi-channel signal switching, fault injection and aviation bus testing.

Semiconductor wafer testing: high-density probe card signal routing, parameter testing and aging screening.

Automotive ECU verification: sensor / load signal simulation, wiring harness conduction test and fault diagnosis.

Industrial sensor network monitoring: multi-node round-trip acquisition, signal conditioning and data recording.

Precision instrument calibration: high-precision switching and calibration system setup for low-level and weak signals.

Military and research testing: high-reliability, high-density signal routing and execution of complex test sequences.

User and maintenance instructions

Key usage points

Installation: Insert into the standard 3U PXI chassis slot, lock the panel, ensure reliable contact of the backplane connectors.

Configuration: Select the matrix topology through NI-SWITCH or MAX software, define channel mapping and trigger parameters NI.

Cabling: Connect the front 150-pin connector to the TB-2640B/TB-2641B terminal block, then transfer to the tested equipment; for high voltage / large current, connect according to specifications to avoid overload NI.

Operation monitoring: Use the onboard relay counting function to regularly read the switching times, evaluate the lifespan NI.

Environment: Working temperature 0–50 °C, avoid strong electromagnetic interference, dust and condensation.

Maintenance instructions

Regular inspection: Check the connector tightness, whether the terminal block wiring is loose, and clean the surface dust every quarter.

Relay life management: Typical life: Low power (10 V/100 mA) approximately 10⁷ times; High power (50 V/0.5 A) approximately 5×10⁵ times, replace the module in time when approaching the lifespan.

Fault troubleshooting: When the channel is not connected or has poor contact, first check the wiring and terminal block, then diagnose the relay status through software; check the grounding and shielding when the thermal offset exceeds the limit.

Storage: When not in use for a long time, disconnect the power supply, place it in a dry, dust-proof environment, and avoid the connectors getting wet and oxidized.


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