GE Panametrics UTXDR 4 MHz is a dual crystal delay line probe operating at 4 MHz frequency. The dual-element structure effectively reduces dead zone, enabling reliable thickness measurement on thin metal substrates and surfaces with coatings. It adopts delay line technology to minimize near-surface signal interference and improve measurement accuracy for thin-wall workpieces.

This transducer is fully compatible with 25DL and other Panametrics portable ultrasonic thickness testers. It requires matched shielded signal cables and ultrasonic couplant to establish stable acoustic coupling. The robust wear-resistant front face can sustain frequent field inspection tasks in industrial environments.

It is ideal for measuring thin steel, aluminum and alloy components, suitable for pipeline thin-wall sections, vessel linings and coated metal structure inspection. Compared with low-frequency probes, the 4 MHz frequency delivers higher resolution, while maintaining moderate penetration capacity for general metallic materials.

Typical application fields include chemical plants, power stations, shipyards and machinery manufacturing for residual thickness testing and quality inspection. Users can order the UTXDR 4 MHz transducer separately or assemble complete inspection kits with thickness gauge host, signal cable and coupling gel for field measurement and spare part reserve.