GE Panametrics 15 MHz Contact Ultrasonic Transducer
July 22, 2026

GE Panametrics 15 MHz Contact Ultrasonic Transducer

GE 15 MHz transducer is a high-frequency ultrasonic probe designed for precision non-destructive testing. It delivers high resolution for thin material thickness measurement and flaw detection.

Description

GE Panametrics 15 MHz ultrasonic contact transducer adopts high-frequency piezoelectric element. Higher frequency provides superior axial resolution, making it ideal for measuring thin workpieces and identifying tiny internal defects that low-frequency probes cannot distinguish.
This transducer fits GE ultrasonic thickness gauges and flaw detectors. It supports contact testing on metals, plastics, coatings and composite materials. The compact wear-resistant probe face ensures stable acoustic coupling when paired with ultrasonic couplant.
Due to higher frequency characteristics, ultrasonic energy attenuates faster, so it is mainly applied to thin specimens and near-surface inspection scenarios. Users can select different element sizes, delay line and housing configurations according to actual testing requirements.
Typical applications include precision component thickness inspection, coating thickness measurement, thin wall pipeline testing, laboratory material analysis and electronic part quality control. It is widely used in machinery manufacturing, aerospace and precision processing industries.
Customers can purchase standalone 15 MHz probes, together with matching cables, couplant and wear caps for laboratory testing, on-site inspection and replacement of old probes.


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