PXIe‑6544 Product Introduction

PXIe‑6544 (Part Number 780992-02) is a 32-channel, 100 MHz, single-ended bidirectional digital waveform generator/analyser developed by NI, belonging to the PXIe‑6500 series. It is a 3U single-slot device equipped with high-performance FPGA and onboard 8 Mbit large-capacity memory. It supports multi-level, high-precision timing and complex mode generation/collecting, and is targeted at medium-high-speed digital testing and mixed-signal system integration.

Model Interpretation

PXIe: PXI Express bus, 3U size, Gen1 x4, single-slot independent bandwidth, supports DMA, RTSI and PXI trigger.

6544: The 100 MHz, 32-channel, single-ended, basic version digital waveform instrument in the 6500 series, without hardware comparison and PMU.

Core Identification: Bidirectional I/O, 100 MHz, 8 Mbit / channel, multi-level, mode sorting, trigger synchronization. Technical Specifications

Channels and Electricals

Channel: 32 single-ended bidirectional I/O, each channel has independent input/output configuration.

Logic level: Software selectable: 1.2 V, 1.5 V, 1.8 V, 2.5 V, 3.3 V (5 V TTL is not supported).

Input voltage: -1 V to + 4 V; Output drive: 24 mA per channel.

Signal type: Single-ended, non-differential.

Timing and Performance

Maximum clock: 100 MHz (single cycle 10 ns).

Data rate: 100 Mbit/s (same generation/collecting rate).

Onboard memory: 8 Mbit per channel, total 256 Mbit, supports long waveform storage.

Clock system: 800 MHz VCO + 32-bit DDS, resolution 0.2 Hz, accuracy ±150 ppm.

Synchronization: Supports multi-module/multi-rack synchronization, channel-to-channel jitter ≤ 1 ns.

General Specifications

Bus: PXIe Gen1 x4, single slot, supports DMA, RTSI, PXI trigger.

Connector: Front panel 68-pin VHDCI (DDC) + 3 SMA (CLK IN, CLK OUT, PFI0).

Power consumption: +3.3 V approximately 1.75 A, +12 V approximately 2.2 A, total power consumption ≈ 32.2 W.

Operating temperature: 0 °C to + 55 °C, industrial grade download.ni.com.

Size/Weight: 3U (21.6×2.0×13.0 cm), approximately 519 g.

Interface and Communication Configuration

Host interface: PXIe bus, plug-and-play, high-speed DMA transmission, supports RTSI real-time synchronization and PXI trigger bus.

Front panel interface: 68-pin VHDCI (DDC) integrates 32 channels of I/O, clock, trigger and event signals; 3 SMA for external clock input/output and PFI trigger, suitable for high-frequency synchronization requirements.

Trigger and Synchronization: Supports software, edge, handshake, mode triggering; can be synchronized with 6545/6547/6548 multi-modules, aligning timing with 100 MHz base clock.

Driver Software: NI-DAQmx, compatible with Windows / real-time systems, supports LabVIEW, C/C++, Python, TestStand, providing waveform editing, mode sorting and timing configuration APIs. Core function

32-channel bidirectional waveform generation / acquisition: Each channel is independently configured, synchronously generating excitation and acquisition responses, suitable for parallel testing.

Flexible multi-level adaptation: Software switching from 1.2 V to 3.3 V, covering mainstream low-voltage digital devices without requiring hardware modifications.

Large-capacity onboard memory: 8 Mbit per channel, supporting long sequence mode storage and playback, reducing bus dependency.

High-precision clock and timing: DDS low-jitter clock, jitter ≤ 1 ns between channels, meeting strict timing test requirements.

Mode sorting and triggering: Supports multi-waveform sequences, loops, conditional branches, enriching trigger sources to adapt to complex testing processes.

Mixed-signal system integration: Can be synchronized with PXIe oscilloscopes and arbitrary waveform generators to build a complete digital-analog mixed testing system. Applicable scenarios

Digital chip verification: Function tests of MCU, FPGA, interface chips, protocol simulation, timing verification.

Semiconductor testing: Pattern generation/capture for medium-speed memory and logic devices, mass production functional tests.

Embedded system testing: Simulation of embedded device buses (SPI, I²C, UART), peripheral interface tests.

Display and image testing: Medium-speed LCD/OLED panels, digital interface tests for image sensors.

Industrial control and communication: Digital I/O control and status acquisition for PLC, industrial buses, communication modules.

User and maintenance instructions

Key points of use

Installation: Insert into a single slot of a 3U PXIe chassis, tighten the screws, and recommend using high-performance chassis such as PXIe-1085 to ensure power supply and heat dissipation.

Cabling: Use the accompanying VHDCI shielded cable. For high-frequency (≥50 MHz), the cable length should be ≤ 1 m; for SMA clock lines, select 50 Ω coaxial cables to reduce signal reflection.

Configuration: Set the channel direction, level, clock frequency, and trigger mode in NI-MAX/DAQmx; configure the mode sequence and synchronization parameters as needed.

Timing considerations: For high-frequency applications, strictly control the cable length and grounding to avoid crosstalk; calibrate the reference clock before synchronous testing.

Maintenance and calibration

Cleaning: Regularly wipe the panel and connectors with a dry soft cloth to remove dust and prevent liquid contact.

Calibration: Digital I/O does not require regular calibration; it is recommended to check the output level, drive current, and timing accuracy every 2 years.

Storage: When not in use for a long time, store in a dry environment at -20 °C to + 60 °C with a humidity of ≤ 60%, and take precautions against static electricity.

Troubleshooting: When there is an anomaly, first check the wiring, power supply, and software configuration; for timing anomalies, check the cable and grounding; for output anomalies, check if the load is overloaded or short-circuited.