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PXIE-5632

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PXIE-5632
May 27, 2026

PXIE-5632

The PXIe-5632 is a 3U three‑slot PXI Express 2‑port vector network analyzer (VNA) from National Instruments, covering 300 kHz to 8.5 GHz. It adopts a dual‑source architecture to support full S‑parameter measurements and frequency‑translating device testing. Featuring >110 dB dynamic range, wide power range, and low‑latency triggering, it enables pulsed S‑parameter characterization. Optimized for automated R&D validation and high‑volume production test, it delivers superior integration and cost‑effectiveness compared to benchtop VNAsNI.

Description

Model Nomenclature

  • PXIe: PXI Express high‑speed modular instrumentation bus.

  • 56: NI PXI RF and IF test instrument series.

  • 32: 2‑port, 8.5 GHz, three‑slot, dual‑source vector network analyzer supporting full S‑parameters and frequency‑offset measurementsNI.

Technical Specifications

  • Form Factor: 3U three‑slot PXIe module.

  • Ports: 2 (PORT1/PORT2, 50 Ω, K‑type or N‑type connectors).

  • Frequency Range: 300 kHz to 8.5 GHz; 10 Hz resolution.

  • Dynamic Range: >110 dB (typical).

  • Noise Floor: <‑120 dBm/Hz.

  • Source Power: ‑30 dBm to +15 dBm; 0.01 dB step.

  • Sweep Speed: <500 μs/point (3,201 points).

  • IF Bandwidth: 10 Hz to 500 kHz (independently adjustable).

  • Reference Clock: External 10 MHz (SMA); internal optional.

  • Trigger: PFI 0 (SMA, 3.3 V TTL), low‑latency trigger.

  • Operating Temperature: 0 °C to 55 °C; Storage: ‑40 °C to 70 °C.

  • Optional Feature: Time Domain Analysis (TDR/TDT), part number 782299‑02.

Interface and Communication Configuration

  • Bus: PXIe Gen1 x1, supporting high‑speed DMA and peer‑to‑peer data streaming.

  • Drivers: NI‑VNA, IVI‑COM; compatible with LabVIEW, C/C++, Python, .NET.

  • Software: NI‑MAX (configuration/calibration), NI‑VNA Soft Front Panel (interactive control).

  • Synchronization: PXI trigger bus, star trigger, NI‑TClk for multi‑module phase synchronization.

  • Calibration: Supports SOLT, TRL, LRM, automatic precision calibration, and reference plane extensionNI.

Core Features

  • Full Vector S‑Parameter Measurement: Precise S11, S12, S21, S22 acquisition with amplitude, phase, and impedance data.

  • Dual‑Source & Frequency Offset Capability: Enables testing of mixers, converters, and other frequency‑translation devices.

  • Pulsed S‑Parameter Measurement: Low‑latency trigger and source access loops support pulsed RF characterization.

  • Wide Dynamic Range & Low Noise: Ensures stable measurement of weak signals and high‑isolation components.

  • Automated Precision Calibration: Built‑in routines minimize manual errors and maintain long‑term accuracyNI.

Application Scenarios

  • RF Component Test: S‑parameter and linear characterization of filters, amplifiers, mixers, antennas, cables, and connectors.

  • Wireless Communication: R&D and production test of 5G/6G front‑end modules, transceivers, and MIMO components.

  • Aerospace and Defense: Phase/amplitude consistency test of radar components, RF links, and electronic warfare modules.

  • Semiconductor Test: Impedance matching and insertion loss characterization of RF chips, packages, and substrates.

  • General‑Purpose Test: Dielectric constant measurement of materials, signal integrity analysis, and RF system integration validationNI.

Usage and Maintenance Instructions

Installation and Configuration

Insert the module into an empty 3U three‑slot PXIe chassis and tighten the front‑panel latch. Connect PORT1 to the excitation side, PORT2 to the load side, and REF IN to a 10 MHz external reference (optional). Power on the chassis; the system will automatically detect the module. Open NI‑MAX to set frequency range, power level, number of points, trigger, and calibration method before starting measurementsNI.

Operation Guidelines

Allow a 15‑minute warm‑up period before high‑precision measurements. Do not apply input signals exceeding +10 dBm to avoid front‑end damage. Select the appropriate calibration type based on the DUT to optimize accuracy. Enable automatic calibration during long‑term testing to compensate for temperature driftNI.

Daily Maintenance

Keep the module, cables, and connectors clean, dry, and well‑ventilated. Tighten K‑type connectors gently to avoid damaging inner pins. Inspect cables and connections regularly for aging or poor contact. Perform monthly self‑calibration and annual external calibration. When not in use, power off the module, disconnect all cables, and store it in an ESD‑protected environmentNI.


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