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PXIE-5630

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PXIE-5630
May 27, 2026

PXIE-5630

The PXIe-5630 is a 3U two‑slot PXI Express 2‑port vector network analyzer (VNA) from National Instruments, designed for vector measurements of transmission and reflection (S11/S21) in RF components. It covers 10 MHz to 6 GHz, delivers >110 dB dynamic range, low noise floor, and fast sweep speed, making it ideal for automated design validation and high‑volume production test. Compared to benchtop VNAs, it provides equivalent performance in a compact, modular form factor with lower cost and easier system integration.

Description

Model Nomenclature

  • PXIe: PXI Express high‑speed modular instrumentation bus.

  • 56: NI PXI RF and IF test instrument series.

  • 30: 2‑port, 6 GHz, two‑slot vector network analyzer supporting T/R (transmission/reflection) and full S‑parameter vector analysis.

Technical Specifications

  • Form Factor: 3U two‑slot PXIe module.

  • Ports: 2 (PORT1/PORT2, 50 Ω, K‑type connectors).

  • Frequency Range: 10 MHz to 6 GHz; 10 Hz resolution.

  • Dynamic Range: >110 dB (typical).

  • Noise Floor: <‑123 dBm/Hz.

  • Source Power: ‑30 dBm to +5 dBm; 0.5 dB step.

  • Sweep Speed: <400 μs/point (3,201 points).

  • IF Bandwidth: 10 Hz to 30 kHz.

  • Reference Clock: External 10 MHz (SMA); internal optional.

  • Trigger: PFI 0 (SMA, 3.3 V TTL).

  • Operating Temperature: 0 °C to 55 °C; Storage: ‑40 °C to 70 °C.

Interface and Communication Configuration

  • Bus: PXIe Gen1 x1, supporting high‑speed DMA and peer‑to‑peer data streaming.

  • Drivers: NI‑VNA, IVI‑COM; compatible with LabVIEW, C/C++, Python, .NET.

  • Software: NI‑MAX (configuration/calibration), NI‑VNA Soft Front Panel (interactive control).

  • Synchronization: PXI trigger bus, star trigger, NI‑TClk for multi‑module phase synchronization.

  • Calibration: Supports SOLT, TRL, automatic precision calibration, and reference plane extension.

Core Features

  • Full Vector S‑Parameter Measurement: Precise S11 (reflection) and S21 (transmission) measurement with amplitude, phase, and impedance data.

  • Wide Dynamic Range and Low Noise: Enables stable and reliable measurement of weak signals and high‑isolation devices.

  • Fast Sweep Speed: Maximizes production throughput, suitable for parallel testing of multiple DUTs.

  • Automated Precision Calibration: Built‑in calibration routines reduce manual errors and ensure long‑term accuracy.

  • Modular Integration: Seamlessly integrates with PXIe‑5622, PXIe‑5653, and other NI RF instruments to form a unified test system.

Application Scenarios

  • RF Component Test: S‑parameter and linear characterization of filters, amplifiers, mixers, antennas, cables, and connectors.

  • Wireless Communication: R&D and production test of 5G/6G front‑end modules, transceivers, and MIMO components.

  • Aerospace and Defense: Phase/amplitude consistency test of radar components, RF links, and electronic warfare modules.

  • Semiconductor Test: Impedance matching and insertion loss characterization of RF chips, packages, and substrates.

  • General‑Purpose Test: Dielectric constant measurement of materials, signal integrity analysis, and RF system integration validation.

Usage and Maintenance Instructions

Installation and Configuration

Insert the module into an empty 3U two‑slot PXIe chassis and tighten the front‑panel latch. Connect PORT1 to the excitation side, PORT2 to the load side, and REF IN to a 10 MHz external reference (optional). Power on the chassis; the system will automatically detect the module. Open NI‑MAX to set frequency range, power level, number of points, trigger, and calibration method before starting measurements.

Operation Guidelines

Allow a 15‑minute warm‑up period before high‑precision measurements. Do not apply input signals exceeding +10 dBm to avoid front‑end damage. Select the appropriate calibration type based on the DUT to optimize accuracy. Enable automatic calibration during long‑term testing to compensate for temperature drift.

Daily Maintenance

Keep the module, cables, and connectors clean, dry, and well‑ventilated. Tighten K‑type connectors gently to avoid damaging inner pins. Inspect cables and connections regularly for aging or poor contact. Perform monthly self‑calibration and annual external calibration. When not in use, power off the module, disconnect all cables, and store it in an ESD‑protected environment.


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