T supports single-channel switching and sequential scanning

Adaptation and expansion

Adaptation cables: SMA-SMA direct connection; optional SMA to BNC/SMB/MCX conversion

Expansion capability: multi-module cascading, forming an N×N matrix or large-scale multiplexer, no external terminal required throughout the process

VII. Core functions

Dual-channel SPDT + built-in terminal: each channel integrates a 50Ω load, open-circuit channels automatically match, completely eliminating reflection risks, protecting the source end and DUTNI.

DC～2.7 GHz wideband coverage: covers Bluetooth, WiFi, ISM, 2G/3G, etc., meeting the needs of consumer electronics, industrial radio frequency and general testing by NI.

Low loss high isolation + excellent VSWR: low insertion loss, high isolation, small standing wave ratio, maximizing signal integrity, reducing test errors by NI.

Relay life management: on-board counter counts the number of channel switches for each path in real time, predicts lifespan, reducing unplanned downtime by NI.

PXI standard integration: single slot 3U size, seamless integration into PXI chassis, supports hardware trigger synchronization, compatible with automated ATE systems.

Latch relay + low power consumption: latch design, no continuous power supply required after switching, low power consumption, low heat generation, high stability.

VI. Application scenarios

High reflection risk RF testing: frequent switching between signal source/spectrum analyzer/network analyzer and DUT to prevent open-circuit reflection from damaging instruments, especially suitable for high-power scenarios by NI.

Consumer electronics RF mass production testing: verification and mass testing of Bluetooth, WiFi, NFC module functions, no need for manual load connection, improving testing efficiency and consistency.

High-channel-count multiplexer construction: multi-module cascading, forming a large-scale SPDT matrix, consistent throughout the path, no external terminal required, suitable for parallel testing of multiple DUTs by NI.

Research and development laboratories and precision measurement: RF link debugging, matching test, multi-scheme comparison, low reflection ensures test accuracy, reducing system errors by NI.

Semiconductor RF chip testing: functional verification, parameter testing, aging screening of medium-low frequency RF ICs, high reliability, long lifespan, suitable for high-frequency switching in mass production.

VII. Usage and maintenance instructions

Usage points

Installation: standard 3U PXI single slot, lock the panel, ensure reliable contact of the backplane; avoid strong vibration and electromagnetic interference.

Connection: SMA connector is lightly inserted and removed, avoid violence; RF power ≤ 10 W (continuous), terminal withstand power ≤ 1.5 W @ 25°C,严禁 operating beyond power limit.

Power-on state： default each COM and NC are connected (normally closed)， NO is disconnected； NO/NC has a 50Ω terminal built-in， no external load required by NI.

Software control： use NI-SWITCH or LabVIEW VI to control each SPDT； regularly read relay counters to monitor remaining lifespan by NI.

Environment： 0～55 °C operation， dust-proof， moisture-proof， dew-proof； away from strong electromagnetic interference， ensure good grounding.

Maintenance instructions

Regular inspection： inspect SMA connector for looseness， oxidation or damage every quarter； clean the panel and ventilation ports， maintain good heat dissipation.

Life management： electromechanical relays approximately 1 million times； regularly read onboard counters， plan replacement in advance to avoid downtime by NI.

Fault troubleshooting： first check SMA connection， grounding； use MAX to diagnose switch status； take precautions against static electricity to avoid module damage by NI.

Storage： disconnect power when not in use， cover SMA with a dust cap， dry and dust-proof storage， avoid high temperature， high humidity and strong magnetic fields. Calibration: It is recommended to calibrate once a year to ensure that the insertion loss, isolation, VSWR, etc. meet the specifications; you can contact NI or a third-party calibration institution.