Part Code Definition

PXI = PCI Extensions for Instrumentation bus specification

4071 = fixed model code for 7.5-digit 1kV FlexDMM with 1.8MS/s isolated digitizer

Technical Specifications

Measurement Resolution：7½ digits(26bit) for DC Voltage & Resistance; 6½ digits(22bit) for ACV/DCA/ACA/Freq

DC Voltage Range：±10nV ~ ±1000VDC; AC True RMS：100μV~1000VAC, 1Hz~1MHz bandwidth

DC Current：1pA~3A(8 ranges); AC Current：100μA~3A(6 ranges)

Resistance：2-wire /4-wire ohm, 10μΩ~5GΩ full span

Digitizer Performance：Isolated waveform sampling up to 1.8MS/s, all ranges DC-coupled acquisitionNI

DMM Reading Speed：7 readings/s @7.5digits; max 10kS/s @4.5digits high-speed mode

Isolation Rating：500V common-mode isolation, input withstand up to 1000V safety rated

Operating Temp：0~50℃ operation, -20~70℃ storage; recommended 1-hour warm-up before precision calibration, 2-year calibration cycle

Power Consumption：~12W typical single-slot power draw from PXI backplane

Interface & Communication Configuration

Front Panel I/O：4 safety-rated gold-plated banana terminals(VΩ, LO, A, mA) + 9pin mini-DIN AUX I/O port for external trigger & SCXI bus communicationNI

Backplane Bus：Standard PXI peripheral slot bus, access PXI system trigger bus & 10MHz reference clock for multi-module synchronous measurement

Driver Support：NI-DMM driver, compatible with LabVIEW, LabWindows/CVI, TestStand, NI-DAQmx; works with NI PXI switch modules for multi-channel scanning test

Core Functions

1.High-precision multi-parameter DMM measurement: DC/AC voltage, DC/AC current, 2/4-wire resistance, frequency/period, diode forward test

2.Isolated high-speed digitizer to capture transient pulse & AC waveform at 1.8MS/s sampling rate without extra DAQ cardNI

3.Galvanic isolation eliminates ground loop interference for floating source high-voltage measurement

4.Collocate with PXI relay switch modules to build multi-channel automated sequential scanning measurement system

5.Low-level micro-signal test for leakage current, component IV curve, converter linearity characterization

Application Scenarios

Semiconductor component parametric test, fuel cell characteristic measurement, power supply output precision calibration, aerospace electronic batch screening, laboratory low-noise micro-parameter measurement, legacy PXI test bench spare replacement

Operation & Maintenance Notes

Strictly follow 1000V input safety rating, avoid overvoltage impulse damage; complete 1h warm-up before high-accuracy metering; use shielded low-thermal test leads for nV/pA tiny signal measurement; periodic two-year factory calibration; cut chassis power before plug/unplug module; keep front terminal insulating surface clean to reduce surface leakage error.