NI-4130
May 15, 2026

NI-4130

The NI‑4130 is a 2‑channel precision PXI source measure unit (SMU) module. It combines a high‑power four‑quadrant SMU channel and a single‑quadrant auxiliary power supply in one single PXI slot. It can simultaneously source and measure voltage and current, widely used for semiconductor characterization, component testing, and precision DC parametric measurement.

Description

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NI-4130

National Instruments PXI-4130 Source Measure Unit

General Description

The NI‑4130 is a 2‑channel precision PXI source measure unit (SMU) module. It combines a high‑power four‑quadrant SMU channel and a single‑quadrant auxiliary power supply in one single PXI slot. It can simultaneously source and measure voltage and current, widely used for semiconductor characterization, component testing, and precision DC parametric measurement.

Key Specifications

  • Form Factor: 3U PXI single slot module

  • Channel 1 (Main SMU):

    • Voltage range: ±20 V

    • Current range: ±2 A

    • 4‑quadrant operation: source and sink power

    • Power sourcing up to 40 W, power sinking up to 10 W

    • Current resolution down to 1 nA

    • 4‑wire remote sense support

    • Isolated output design

  • Channel 0 (Auxiliary Supply):

    • Voltage range: 0 V to 6 V

    • Current range: 0 A to 1 A

    • 16‑bit set and measure resolution

  • Measurement Resolution: 16‑bit for voltage and current

  • Software Driver: NI‑DCPower

  • Operating Temperature: 0 °C to +55 °C

  • Recommended Calibration Interval: 1 year

Main Features

  • Integrated two channels in one PXI slot, saving chassis space

  • Four-quadrant SMU supports forward and reverse power sourcing and sinking

  • High precision and ultra-low current resolution for small signal device testing

  • Built-in isolation reduces ground loop interference and improves system safety

  • Support for 4-wire remote sensing to eliminate lead resistance error

  • Compatible with LabVIEW, CVI, Python, C# and other programming environments

  • Fast settling time for automated parametric test systems

Applications

  • Semiconductor device parametric characterization

  • Diode, transistor, MOSFET and power component testing

  • Battery and energy storage device charging, discharging and cycle testing

  • Sensor, module and low-power circuit DC performance verification

  • Automated test equipment and laboratory precision measurement systems


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